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150 Years of the Metre Convention: Science, Innovation & Global Impact
20 May 2025 will be the 150th anniversary of the signing of the Metre Convention and therefore a special World Metrology Day. It will be marked by an event held to celebrate the achievements of 150 years of the BIPM.
Speakers’ contributions will span all the way from the history of the BIPM as one of the oldest international organizations of the world to the current challenges in metrology. They will focus on the scientific achievements of 150 years of metrology and the unique international scientific collaboration under the Metre Convention.
Registration at the welcome desk
Opening and High-Level Opening Remarks
Lidia Arthur Brito
Assistant Director-General, UNESCO – United Nations Education, Scientific and Cultural Organization
Askar Abdrakhmanov
Permanent Delegate of the Republic of Kazakhstan to the United Nations Education, Scientific and Cultural Organization (UNESCO)
Jean Lamy
Deputy Director of Diplomatic and Consular Privileges and Immunities
Ministry of Europe and Foreign Affairs
Ministry of Europe and Foreign Affairs
Keynote Address: “The SI – a Tool for All Mankind”
William D. Phillips
NIST - National Institute of Standards and Technology, United States of America, Nobel Prize in physics 1997
Panel Discussion : “Navigating the future of Metrology: Addressing Scientific and Technical Multilateralism Challenges”
Alessandro De Angelis
Permanent Delegation of Italy to international organizations in Paris and University of Padua, Italy
12:45 to 14:30 - Lunch break
150 Years of International Use of the Metric System
Panel Discussion: “Future Challenges for Global Metrology”
Nathalie von Siemens
Closing note and closing remarks
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